Product

Spectral Response Measurement

Spectral Response / Quantum Efficiency / I-V Measurement System

We have developed the systems which can measure spectral response and quantum efficiency by irradiating a monochromatic light with constant energy and constant photons  without dependence on the wavelength.

Our unique system such as the CEP series employing a real time light amount monitoring and controlling system is enabled to monitor and control light amount all the times to maintain it constant. Our system offer excellent measurement stability and reproducibility without any influence of fluctuation of the light intensity.

 

model CEP-25ML

 

CEP-25RR Spectral Response & Internal Quantum Efficiency Measurement System Sample Various photovoltaic cells

Features

 The CEP-25RR is capable to obtain internal quantum efficiency by measuring not only spectral response but also reflectance with a single system while conventionally two separate systems such as the spectral response system and spectrophotometer with a reflectance accessory have been required.  The same target area on the sample can be measured both in spectral response and reflectance measurement with the same beam.

 

CEP-25ML Spectral Response Measurement System covering wide range

Sample

   Multi-junction solar cells and Compound semiconductor solar cells

Features

 The CEP-25ML is the system which is complied with the method for spectral response measurement stipulated in Japan Industrial Standard ( JIS ). Covering wide range in high speed, the CEP-25ML is capable to measure each layer of the solar cell continuously.

 

 CEP-2000 Spectral Response Measurement System for Dye Sensitize / Organic Thin Film

Samples

 Dye Sensitize Photovoltaic Cells and Organic Thin Film Photovoltaic Cells

Features

The Model CEP-2000 has been developed for measurement of the solar cells which have been made by improving the silicon solar cells, show a bad response and also require high power light irradiation.

 

Desktop Spectral Response and IPCE Measurement System

As a reference, the amount of irradiation light at each wavelength is measured and then spectral response can be measured on the basis of it.

 

model SM-250

 

SM-250 IPCE Measurement System ( automatic measurement system ) Sample Various solar cells

Features

 The dye sensitized solar cells and organic thin film solar cell can be measured with a good uniformity in-plane 5mW/cm-2 monochromatic light.  Quantum efficiency also can be calculated.

 

SM-25 Basic Monochromatic Light Irradiation system Sample Various solar cells

Features

The SM-25 enable to irradiate a monochromatic light of 5mW/cm2 ( at 470nm ) with good uniformity in-plane.

 

 

Current Voltage Measurement Solar Simulator

Our solar simulators have employed unique optics which creates and irradiates high quality pseudo sunlight with deep focal depth. They have offered excellent accuracy for measurement of characteristics of the solar cells with back side incidence and thick solar cells.

model OTENTO-SUN III
 

OTENTO-SUN V Solar Simulators ( 50mm x 50mm )

Specifications
Irradiation area: 50mm x 50mm
Spectral coincidence: 0.75 ~ 1.25 ( Class A )
Non uniformity in-plane: ±2% ( Class A )
Irradiation intensity: 100mW/cm2 ( 1 SUN )
Irradiation stability: within ±1% ( Class A )

Features
The OTENTO-SUN V is capable to measure the large surface area solar cells.  Horizontal irradiation can be offered as an option,

 

OTENTO-SUN III Solar Simulators ( 20mm x 20mm )

Specifications
Irradiation area: 20mm x 20mm
Spectral coincidence: 0.75 ~ 1.25 ( Class A )
Non uniformity in-plane: ±2% ( Class A )
Irradiation intensity: 100mW/cm2 ( 1 SUN )
Irradiation stability: within ±1% ( Class A )

Features
The OTENTO-SUN III is economical while maintaining excellent performance.  Angle of the outgoing light is variable to 360 degree, which allows the perpendicular and also horizontal irradiation.
This system will be uses as a light source for our SM series ( Spectral Response Measurement systems ).

 

OTENTO-SUN II Solar Simulators ( 20mm x 20mm )

Specifications
Irradiation area: 20mm x 20mm
Spectral coincidence: 0.75 ~ 1.25 ( Class A )
Non uniformity in-plane: ±2% ( Class A )
Irradiation intensity: 100mW/cm2 ( 1 SUN )
Irradiation stability: within ±1% ( Class A )

Features
The OTENTO-SUN II offers excellent stability by employing a constant irradiation system.
This system will be also used as a white bias light for our CEP series ( spectral response measurement systems ).

We can offer customized systems such as the systems with larger irradiation area and two light sources. Please feel free to contact us.

 

 

I-V Measurement system

 

Specifications
Measurement Items for software
Short-circuit current density, open-circuit voltage, maximum power, maximum power voltage, maximum power current, fill factor, conversion efficiency, series resistance, shunt resistance

Features
The I-V measurement system consists of a source meter and software.  The measurement results which comply with Japanese Industrial Standard ( JIS ) can be obtained from the I-V curve.